YEAST 2017

28th International Conference on Yeast Genetics and Molecular Biology (ICYGMB)

August 27 – September 1, 2017
Prague, Czech Republic


Paper ID: 24

Draft Genome Sequence of the Multi-Stress Tolerant Yeast Pichia farinosa 

Kwon Hun-Joo, Park Eun-Hee, Kim Myoung-Dong

Department of Food Science and Biotechnology, Kangwon National University, Chuncheon 24341, Korea (South Korea)

ABSTRACT

Posters and workshop presentations do not have public abstracts.
Participants may find them in Conference materials.

Keywords:
genome sequence, multi-stress tolerance, Pichia farinosa, Nuruk
Presented as:
  Poster [PS14-6] in PS14 Yeast and industrial biotechnologies

Institute of Microbiology

YEAST 2017
28th International Conference on Yeast Genetics and Molecular Biology (ICYGMB)

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