YEAST 2017

28th International Conference on Yeast Genetics and Molecular Biology (ICYGMB)

August 27 – September 1, 2017
Prague, Czech Republic


Paper ID: 135

Combining the Mother Enrichment Program with High-Throughput Replica-Pinning to Identify Genes that Suppress the Accumulation of Mutations

Novarina Daniele, Janssens Georges, Bokern Koen, Schut Tim, Van Oerle Noor, Veenhoff Liesbeth, Chang Michael

European Research Institute for the Biology of Ageing (Netherlands)

ABSTRACT

Posters and workshop presentations do not have public abstracts.
Participants may find them in Conference materials.

Keywords:
Genome stability, Mutagenesis, Mother enrichment program, High-throughput screen
Presented as:
  Poster [PS7-4] in PS7 Mutagenesis, DNA damage and repair
  Oral presentation [W5-6] in W5 New tools in yeast research

Institute of Microbiology

YEAST 2017
28th International Conference on Yeast Genetics and Molecular Biology (ICYGMB)

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